2 February 1988 Measurement Considerations For Future High Speed Computer Packaging
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Proceedings Volume 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits; (1988) https://doi.org/10.1117/12.940935
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
Abstract
The decrease in the cycle times of computers has resulted from improvements in the performance of the active circuits and the passive structures on which these circuits are packaged. In this paper we first summarize the state of the art in high-performance computer packaging. Estimates of future requirements for package interconnection structures are then described along with a few measurement techniques that can be used to characterize their electrical properties. High-speed measurements on an experimental thin-film transmission line structure obtained using three of these techniques are presented to illustrate the different measurement considerations.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. V. Kopcsay, G. V. Kopcsay, G. Arjavalingam, G. Arjavalingam, A. Deutsch, A. Deutsch, } "Measurement Considerations For Future High Speed Computer Packaging", Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); doi: 10.1117/12.940935; https://doi.org/10.1117/12.940935
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