Simple And Inexpensive Method For Testing High Speed Semiconductor Devices Using Electro-Optics Sampling

K. W. Forsyth; R. S. Jones; J. R. Lindemuth

doi:10.1117/12.940956

2 February 1988 Simple And Inexpensive Method For Testing High Speed Semiconductor Devices Using Electro-Optics Sampling

K. W. Forsyth, R. S. Jones, J. R. Lindemuth

Author Affiliations +

Proceedings Volume 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits; (1988) https://doi.org/10.1117/12.940956
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

A new method of semiconductor device testing is described which enables the use of electro-optic sampling for routine semiconductor device measurements. The technique is well suited for testing of discrete devices in die form. Pulse risetimes less than 4 picoseconds, corresponding to frequencies well over 100 GHz, are generated and measured, with sensitivities of a few millivolts.

Citation Download Citation

K. W. Forsyth, R. S. Jones, and J. R. Lindemuth "Simple And Inexpensive Method For Testing High Speed Semiconductor Devices Using Electro-Optics Sampling", Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); https://doi.org/10.1117/12.940956

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