1 January 1987 In-Process Measurement Of Surface Texture
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Proceedings Volume 0802, In-Process Optical Metrology for Precision Machining; (1987) https://doi.org/10.1117/12.967115
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
The process of single point generation of a surface, although convenient for the manufacture of aspherical surfaces without apparently the need for final polishing, usually results however in some residual surface texture. The effect of polishing defects, such as roughness and flaws, on the quality of different optical systems is reviewed and discussed in order to illustrate the significance of residual texture in terms of perceived quality and function. Different methods for in-process measurement of texture are described, together with results recently obtained on the measurement of turned surfaces at various stages of tool wear.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lionel R Baker, Lionel R Baker, John K Myler, John K Myler, } "In-Process Measurement Of Surface Texture", Proc. SPIE 0802, In-Process Optical Metrology for Precision Machining, (1 January 1987); doi: 10.1117/12.967115; https://doi.org/10.1117/12.967115


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