28 September 1987 Measurement Of Surface Profile Changes By The Use Of Moire Fringes With Particular Application To Mass Transfer
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Proceedings Volume 0805, Optical Components and Systems; (1987) https://doi.org/10.1117/12.941381
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
Abstract
The use of Moire fringes for the measurement of mass transfer is reported. In this application, changes in surface profile on a naphthalene plate due to mass transfer take place. The profile changes are measured using Moire fringes and the results are compared with an existing measuring device which uses a height sensitive stylus. Fringe patterns are illustrated on both flat and cylindrical surfaces.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Monica Flanagan, Monica Flanagan, Dennis Wilcock, Dennis Wilcock, Catherine Wykes, Catherine Wykes, } "Measurement Of Surface Profile Changes By The Use Of Moire Fringes With Particular Application To Mass Transfer", Proc. SPIE 0805, Optical Components and Systems, (28 September 1987); doi: 10.1117/12.941381; https://doi.org/10.1117/12.941381
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