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28 September 1987 Optical Imaging By The Surface Photodeposition Effect
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Proceedings Volume 0805, Optical Components and Systems; (1987) https://doi.org/10.1117/12.941375
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
Abstract
The optical imaging properties of the Surface Photodeposition (SP) effect is described. The investigation shows that the process can be used as an imaging and recording method, realizable with various light sources such as lasers, high pressure discharge illuminators or conventional incandescent white light sources. Since the process is readily controllable by the dose of radiation delivered to the photosystem, accurate film thicknesses can be obtained. This facilitates the preparation of various optical devices such as coatings, filters, phase retardation plates, holograms, gratings and optical patterns of recorded data. The resolution and contrast were tested by projection and mask contact methods. In both methods the linewidth resolution obtained for the recorded images was about 1-2 (μm). This figure, however, was the basic resolution of the optical imaging system and the original mask. Theoretical arguments lead us to assume that the effect can provide even better resolution due to its special feature as a direct one step additive photographic process.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Peled and Y. Dror "Optical Imaging By The Surface Photodeposition Effect", Proc. SPIE 0805, Optical Components and Systems, (28 September 1987); https://doi.org/10.1117/12.941375
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