18 September 1987 Development Of The Imaging Spectrometer: Technical Challenges And Solutions
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Proceedings Volume 0810, Optical Systems for Space Applications; (1987) https://doi.org/10.1117/12.941530
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
In recent years, a new class of instrument has been emerging for Earth and planetary remote sensing applications.1,2 Most often referred to as imaging spectrometers, or sometimes mapping spectrometers, these new instruments are of increasing interest because of their capability to perform direct identification of surface materials through their spectral signatures. This paper describes some of the system design and technology tradeoffs associated with the development of such instruments and gives design examples for both Earth and planetary applications.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark Herring, Mark Herring, James E. Duval, James E. Duval, Steven A. Macenka, Steven A. Macenka, } "Development Of The Imaging Spectrometer: Technical Challenges And Solutions", Proc. SPIE 0810, Optical Systems for Space Applications, (18 September 1987); doi: 10.1117/12.941530; https://doi.org/10.1117/12.941530

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