1 January 1987 A New Parameter In The ATR Technique For Optical Constants Determination
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Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967231
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
The Attenuated Total Reflection (ATR) method has shown to be a powerful tool for optical characterization of metal surfaces /1/. The effect of a double interface /2/ and the modification of surface electromagnetic waves (SEW) by very thin layers /3/ have also been studied using this technique.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. E. Regalado, R. Machorro, "A New Parameter In The ATR Technique For Optical Constants Determination", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967231; https://doi.org/10.1117/12.967231
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