1 January 1987 A New Parameter In The ATR Technique For Optical Constants Determination
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Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967231
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
The Attenuated Total Reflection (ATR) method has shown to be a powerful tool for optical characterization of metal surfaces /1/. The effect of a double interface /2/ and the modification of surface electromagnetic waves (SEW) by very thin layers /3/ have also been studied using this technique.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. E. Regalado, L. E. Regalado, R. Machorro, R. Machorro, } "A New Parameter In The ATR Technique For Optical Constants Determination", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967231; https://doi.org/10.1117/12.967231
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