Various computerized image-processing methods have been developed for analyzing spatial patterns of specific components in given images. In pattern recognition studies, patterns are classified into different components in the feature space by comparing component features, for example, shape, size, density, histogram, direction, etc. However, it often happens that the components can not be classified in the feature hyperspace because of their mutual dependency in spatial domain. We calim that, in such a case we should use spectral (optical frequency) information of components. Different materials must have different spectroscopic responses to electromagnetic waves of a certain energy band.