1 January 1987 Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
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Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967396
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
The absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3).
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M. S. Sthel, M. S. Sthel, J. J. Lunazzi, J. J. Lunazzi, E. N. Hogert, E. N. Hogert, N. G. Gaggioli, N. G. Gaggioli, "Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967396; https://doi.org/10.1117/12.967396
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