1 January 1987 Statistical-Image-Surface Conception In Analysis Of Electrostatic Electron-Optical Imaging Systems
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Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967278
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
Progress of computational methods in electron optics makes possible to determine focusing properties of real electron-optical systems by means of electron trajectories analysis (e.g.U] ). These problems have essential practical meaning in optics in general. For real optical systems the rays method of the image properties analysis seems to be useful.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. M. Woznicki, J. M. Woznicki, "Statistical-Image-Surface Conception In Analysis Of Electrostatic Electron-Optical Imaging Systems", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967278; https://doi.org/10.1117/12.967278
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