1 January 1987 The Application Of Spatial Light Modulators To Real-Time Opto-Electronic Inspection Of Manufactured Glass Jars
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Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967372
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
Defects in machine-blown glassware, known as stuck glass, are caused by flying glass particles falling into red-hot bottles on an assembly line during manufacturing. These defects can potentially become dislodged when removing food from the glass container. Current inspection machines easily locate gross defects which are larger than the mold marks and lettering on the bottom of glass jars. Inspection of smaller defects, on the order of several mm, is generally performed manually. In this paper we present a real-time opto-electronic inspection machine which uses successfully images small glass defects while suppressing the image of the jar.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Cormack, R. Cormack, K. M. Johnson, K. M. Johnson, W. T. Cathey, W. T. Cathey, F. Dolder, F. Dolder, } "The Application Of Spatial Light Modulators To Real-Time Opto-Electronic Inspection Of Manufactured Glass Jars", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967372; https://doi.org/10.1117/12.967372
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