PROCEEDINGS VOLUME 0814
31ST ANNUAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING | 17-21 AUGUST 1987
Photomechanics and Speckle Metrology
Editor(s): Fu-Pen Chiang
IN THIS VOLUME

1 Sessions, 59 Papers, 0 Presentations
All Papers  (59)
31ST ANNUAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING
17-21 August 1987
San Diego, CA, United States
All Papers
Proc. SPIE 0814, On The Use Of Photoelasticity And Some Numerical Methods, 0000 (17 February 1987); doi: 10.1117/12.941649
Proc. SPIE 0814, Determination Of Stress Intensity Factors (K[sub]1[/sub], K[sub]2[/sub], K[sub]3[/sub]) By Optical Methods, 0000 (17 February 1987); doi: 10.1117/12.941651
Proc. SPIE 0814, Photoelastic Measurements Of Residual Stresses For NDE, 0000 (17 February 1987); doi: 10.1117/12.941652
Proc. SPIE 0814, Determination Of Characteristic Parameters In Three Dimensional Photoelasticity, 0000 (17 February 1987); doi: 10.1117/12.941654
Proc. SPIE 0814, Applications Of Photoelasticity To Elasto-Dynamics, 0000 (17 February 1987); doi: 10.1117/12.941656
Proc. SPIE 0814, Application Of A Microcomputer To A Polariscope Using A Rotating Polariser And One Or Two Wavelengths, 0000 (17 February 1987); doi: 10.1117/12.941658
Proc. SPIE 0814, Half-Fringe Photoelastic Analysis Of Rectangular Plates Subjected To Transverse Loading, 0000 (17 February 1987); doi: 10.1117/12.941660
Proc. SPIE 0814, Determination Of Stress Intensity Factors Of Edge-Cracked Plates By Half-Fringe Photoelasticity, 0000 (17 February 1987); doi: 10.1117/12.941662
Proc. SPIE 0814, An Image Processing Approach To Photoelastic Fringe Patterns, 0000 (17 February 1987); doi: 10.1117/12.941664
Proc. SPIE 0814, Digital Image Processing And Separation Of Dynamic Isopachics And Isochromatics, 0000 (17 February 1987); doi: 10.1117/12.941667
Proc. SPIE 0814, The Hybrid Technique Of Speckle With Finite Element Method In Noncontinuum Mechanical Problems, 0000 (17 February 1987); doi: 10.1117/12.941669
Proc. SPIE 0814, Application Of Stokes Vector To Holographic Photoelasticity, 0000 (17 February 1987); doi: 10.1117/12.941672
Proc. SPIE 0814, The Theory Of Holospeckle Interferometry, 0000 (17 February 1987); doi: 10.1117/12.941676
Proc. SPIE 0814, Statistical Analysis Of Shearography, 0000 (17 February 1987); doi: 10.1117/12.941678
Proc. SPIE 0814, Surface Roughness Measurement By 2-D Digital Correlation Of Speckle Images, 0000 (17 February 1987); doi: 10.1117/12.941680
Proc. SPIE 0814, Determination Of Surface Roughness By Contrast Of Laser Speckle In Real Time, 0000 (17 February 1987); doi: 10.1117/12.941682
Proc. SPIE 0814, Computerization of Data Deduction in Shearography, 0000 (17 February 1987); doi: 10.1117/12.941683
Proc. SPIE 0814, Fringe Formation Of Shearing Speckle Interferometry, 0000 (17 February 1987); doi: 10.1117/12.941684
Proc. SPIE 0814, Review Of Some Achievements Of Specklegraphic Application In Practical Engineering, 0000 (17 February 1987); doi: 10.1117/12.941685
Proc. SPIE 0814, The Objective Speckle Of Stickling Foil And Its Applications, 0000 (17 February 1987); doi: 10.1117/12.941686
Proc. SPIE 0814, Advances In The Laser Speckle Strain Gauge, 0000 (17 February 1987); doi: 10.1117/12.941687
Proc. SPIE 0814, White Light Speckle Method For Vibration Of Plates, 0000 (17 February 1987); doi: 10.1117/12.941688
Proc. SPIE 0814, Automatic Speckle Photography Fringe Analysis: Application To Crack Propagation And Strength Measurement, 0000 (17 February 1987); doi: 10.1117/12.941689
Proc. SPIE 0814, Heterodyne Dual-Plate Specklegram Readout System, 0000 (17 February 1987); doi: 10.1117/12.941690
Proc. SPIE 0814, Strain Determination On Curved Surfaces By Objective White Light Speckles, 0000 (17 February 1987); doi: 10.1117/12.941691
Proc. SPIE 0814, Scattered Light And Fluorescent Photomechanics, 0000 (17 February 1987); doi: 10.1117/12.941692
Proc. SPIE 0814, Optical Strain Measurement System Development, 0000 (17 February 1987); doi: 10.1117/12.941693
Proc. SPIE 0814, DiffractoSight - A New Form Of Surface Analysis, 0000 (17 February 1987); doi: 10.1117/12.941694
Proc. SPIE 0814, Application Of Optical And Photomechanical Techniques In The Study Of Mechanical Joints, 0000 (17 February 1987); doi: 10.1117/12.941695
Proc. SPIE 0814, Study Of Half-Space Elastic Contact Problems By Caustics, 0000 (17 February 1987); doi: 10.1117/12.941696
Proc. SPIE 0814, Optical Methods To Evaluate The Surface Waviness Of SMC Panels, 0000 (17 February 1987); doi: 10.1117/12.941697
Proc. SPIE 0814, Optical Absolute Encoder Using Spatial Filter, 0000 (17 February 1987); doi: 10.1117/12.941698
Proc. SPIE 0814, Optical Anisotropy Of Unloaded Transparent Polymers, 0000 (17 February 1987); doi: 10.1117/12.941699
Proc. SPIE 0814, High Resolution Triangulation Based Range Sensing For Metrology, 0000 (17 February 1987); doi: 10.1117/12.941700
Proc. SPIE 0814, Diffraction Theory Of Double Grating And Its Application, 0000 (17 February 1987); doi: 10.1117/12.941701
Proc. SPIE 0814, Low-Cost Reflective Optical Switches Applied To Non-Contact Liquid Level Set-Point Control, 0000 (17 February 1987); doi: 10.1117/12.941702
Proc. SPIE 0814, A New Optical Method For Determining The Stress Intensity Factor, 0000 (17 February 1987); doi: 10.1117/12.941703
Proc. SPIE 0814, Application Of Moire And Speckle Techniques To Curved Surfaces Using A Periphery Camera, 0000 (17 February 1987); doi: 10.1117/12.941704
Proc. SPIE 0814, The Image Photo-Carrier Theory And Its Application To The Determination Of Principal Stress Direction, 0000 (17 February 1987); doi: 10.1117/12.941705
Proc. SPIE 0814, A Computer Based Moire Technique To Measure Very Small Displacements, 0000 (17 February 1987); doi: 10.1117/12.941706
Proc. SPIE 0814, The Extension Of Classical Moire To Micro-Mechanics, 0000 (17 February 1987); doi: 10.1117/12.941707
Proc. SPIE 0814, Photomechanical Analysis Of Composite And Other Materials, 0000 (17 February 1987); doi: 10.1117/12.941708
Proc. SPIE 0814, Moire Strain Contours Of Crack-Tip Deformation, 0000 (17 February 1987); doi: 10.1117/12.941709
Proc. SPIE 0814, The Application Of Optical Fiber To Moire Method For Studying Vibration, 0000 (17 February 1987); doi: 10.1117/12.941710
Proc. SPIE 0814, Application Of Moire Analysis Of Strain Using Fourier Transform, 0000 (17 February 1987); doi: 10.1117/12.941711
Proc. SPIE 0814, Moire Contouring Of Objects Generated By CAD, 0000 (17 February 1987); doi: 10.1117/12.941712
Proc. SPIE 0814, Moire Topography With Large Contour Intervals, 0000 (17 February 1987); doi: 10.1117/12.941713
Proc. SPIE 0814, Least-Squares Penalty-Constraint Finite Element Method For Generating Strain Fields From Moire Fringe Patterns, 0000 (17 February 1987); doi: 10.1117/12.941714
Proc. SPIE 0814, Moire Strain Gauge With High Sensitivity, 0000 (17 February 1987); doi: 10.1117/12.941715
Proc. SPIE 0814, Holographic And Speckle Interferometry In The UK A Review Of Recent Developments, 0000 (17 February 1987); doi: 10.1117/12.941716
Proc. SPIE 0814, Holographic Interferometry Applied To A Model Study Of Ground Vibrations Produced From Blasting, 0000 (17 February 1987); doi: 10.1117/12.941717
Proc. SPIE 0814, Dual-Reference Holographic Interferometry With A Double Pulsed Laser, 0000 (17 February 1987); doi: 10.1117/12.941718
Proc. SPIE 0814, Fringe Visibility In Electronic Speckle Pattern Interferometry, 0000 (17 February 1987); doi: 10.1117/12.941719
Proc. SPIE 0814, Vibrational Testing Of An X-Ray Concentrator By Holographic Interferometry, 0000 (17 February 1987); doi: 10.1117/12.941720
Proc. SPIE 0814, Fourier-Transform Evaluation Of Holographic Interference Patterns, 0000 (17 February 1987); doi: 10.1117/12.941721
Proc. SPIE 0814, Thermal Characteristics Of Bonded Structure Analysis Using Holography And Infrared Thermography, 0000 (17 February 1987); doi: 10.1117/12.941722
Proc. SPIE 0814, The Application Of Phase Stepping To The Analysis Of ESPI Fringe Patterns, 0000 (17 February 1987); doi: 10.1117/12.941723
Proc. SPIE 0814, Experimental Evaluation Of J-Integral For A Center-Cracked Plate Subject To Quasistatic Thermal Load, 0000 (17 February 1987); doi: 10.1117/12.941724