A Computer Based Moire Technique To Measure Very Small Displacements

Cesar A. Sciammarella; Mansour A. Amadshahi; B. Subbaraman

doi:10.1117/12.941706

17 February 1987 A Computer Based Moire Technique To Measure Very Small Displacements

Cesar A. Sciammarella, Mansour A. Amadshahi, B. Subbaraman

Proceedings Volume 0814, Photomechanics and Speckle Metrology; (1987) https://doi.org/10.1117/12.941706
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

The accuracy that can be achieved in the measurement of very small displacements in techniques such as moire, holography and speckle is limited by the noise inherent to the utilized optical devices. To reduce the noise to signal ratio, the moire method can be utilized. Two system of carrier fringes are introduced, an initial system before the load is applied and a final system when the load is applied. The moire pattern of these two systems contains the sought displacement information and the noise common to the two patterns is eliminated. The whole process is performed by a computer on digitized versions of the patterns. Examples of application are given.

Citation Download Citation

Cesar A. Sciammarella, Mansour A. Amadshahi, and B. Subbaraman "A Computer Based Moire Technique To Measure Very Small Displacements", Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); https://doi.org/10.1117/12.941706

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