Fringe Visibility In Electronic Speckle Pattern Interferometry

Motoki Yonemura; Shigeru Hagihara

doi:10.1117/12.941719

17 February 1987 Fringe Visibility In Electronic Speckle Pattern Interferometry

Motoki Yonemura, Shigeru Hagihara

Proceedings Volume 0814, Photomechanics and Speckle Metrology; (1987) https://doi.org/10.1117/12.941719
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

In electronic speckle pattern interferometry, the visibility of resultant fringes are influenced by inhomogeneity of the object light and the reference light. Moreover, the resultant fringes have granularity, which is the drawback of ESPI. Two methods to improve the visibility of resultant fringes are proposed. One is a normalizing method and another is a phase scanning method. The experiments were carried out using a CCD image sensor, a digital frame memory and a 16-bit micro-computer, and the theoretical considerations were verified.

Citation Download Citation

Motoki Yonemura and Shigeru Hagihara "Fringe Visibility In Electronic Speckle Pattern Interferometry", Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); https://doi.org/10.1117/12.941719

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