17 February 1987 The Application Of Phase Stepping To The Analysis Of ESPI Fringe Patterns
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A detailed investigation has been carried out into the application of digital phase stepping techniques in the computer analysis of Electronic Speckle Pattern Interferometry fringe data. The entire analysis process has been examined from its initial stages of video resolution and digitisation, through to the representation of phase data within a computer matrix for subsequent data analysis. These investigations have utilised standard video analysis equipment as well as specialised analogue and digital devices designed and built in-house. A high resolution, real time digital image processing system has been used in the analysis of the fringe data, for which specific applications software has been designed. A brief description of some of these devices is included, together with the details of their design philosophy and practical application. Each stage of the analysis method has been evaluated from a signal or image processing viewpoint and optimised to give the best results from a phase representation approach. The resulting processing method is described and example images are used to illustrate successive stages.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Kerr, D. Kerr, J. R. Tyrer, J. R. Tyrer, } "The Application Of Phase Stepping To The Analysis Of ESPI Fringe Patterns", Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); doi: 10.1117/12.941723; https://doi.org/10.1117/12.941723


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