Abstract
This paper concerns the work of the Opto-Electronic Precision Machinery Laboratory on the moire principle, manufacture, calibration, and application of radial and linear metrological gratings.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huang Shang-lian, Huang Shang-lian, } "Metrological Grating Technology Developments", Proc. SPIE 0815, Application and Theory of Periodic Structures, Diffraction Gratings, and Moire Phenomena III, (9 February 1987); doi: 10.1117/12.941751; https://doi.org/10.1117/12.941751
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