Optical Testing Of High-Quality Corner Reflectors

J. C. Anctil; D. Pomerleau

doi:10.1117/12.978911

1 January 1987 Optical Testing Of High-Quality Corner Reflectors

J. C. Anctil, D. Pomerleau

Proceedings Volume 0818, Current Developments in Optical Engineering II; (1987) https://doi.org/10.1117/12.978911
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

This article presents two techniques to test the quality of corner reflectors. The first technique uses an autocollimation setup while the second one is based on interferometry. Several corner reflectors were tested with both methods and the results indicate that the characteristics of a corner reflector as provided by the manufacturer are generally not sufficient to select the most appropriate corner reflector for a given experiment.

Citation Download Citation

J. C. Anctil and D. Pomerleau "Optical Testing Of High-Quality Corner Reflectors", Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); https://doi.org/10.1117/12.978911

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available