PROCEEDINGS VOLUME 0821
31ST ANNUAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING | 17-21 AUGUST 1987
Modeling of Optical Thin Films
IN THIS VOLUME

1 Sessions, 23 Papers, 0 Presentations
All Papers  (23)
31ST ANNUAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING
17-21 August 1987
San Diego, CA, United States
All Papers
Proc. SPIE 0821, Computer Simulation Of The Nucleation And Growth Of Optical Coatings, 0000 (2 February 1988); https://doi.org/10.1117/12.941839
Proc. SPIE 0821, Invited Paper Models For Microstructure Evolution During Optical Thin Film Growth, 0000 (2 February 1988); https://doi.org/10.1117/12.941840
Proc. SPIE 0821, Invited Paper Simple Ballistic Deposition Models For The Formation Of Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941841
Proc. SPIE 0821, Invited Paper Thin Film Morphology: Molecular Dynamics Studies, 0000 (2 February 1988); https://doi.org/10.1117/12.941842
Proc. SPIE 0821, Computer Simulation Of The Cross-Sectional Morphology Of Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941843
Proc. SPIE 0821, Development Of Microstructure In Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941844
Proc. SPIE 0821, Thin Film Microstructures: Simulation And Theory, 0000 (2 February 1988); https://doi.org/10.1117/12.941845
Proc. SPIE 0821, Structure-Zone Models Of Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941846
Proc. SPIE 0821, Nucleation And Growth Of Monolayers, 0000 (2 February 1988); https://doi.org/10.1117/12.941847
Proc. SPIE 0821, Computer Simulation Of The Growth Of Two-Element Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941848
Proc. SPIE 0821, Modeling Of Nodular Defects In Thin Films For Various Deposition Techniques., 0000 (2 February 1988); https://doi.org/10.1117/12.941849
Proc. SPIE 0821, Modeling Refractive Index In Mixed Component Systems, 0000 (2 February 1988); https://doi.org/10.1117/12.941850
Proc. SPIE 0821, Computer Simulation Of Substrate Defect Propagation In Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941851
Proc. SPIE 0821, Surface Smoothing Effects Of Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941852
Proc. SPIE 0821, Microstructure Modeling: Scattering And Form Birefringence In Dielectric Thin Films, 0000 (2 February 1988); https://doi.org/10.1117/12.941853
Proc. SPIE 0821, Comparison Of Effective Medium Procedures For Optical Modeling Of Laminar Structures, 0000 (2 February 1988); https://doi.org/10.1117/12.941854
Proc. SPIE 0821, Angular Distributions In Thin-Film Deposition Simulations, 0000 (2 February 1988); https://doi.org/10.1117/12.941855
Proc. SPIE 0821, Repeatability Estimate Of Interference Optical Filters Using Thin Films Process Modeling, 0000 (2 February 1988); https://doi.org/10.1117/12.941856
Proc. SPIE 0821, Thermal Model Of A Switching Fabry-Perot Etalon, 0000 (2 February 1988); https://doi.org/10.1117/12.941857
Proc. SPIE 0821, Rugate Filters By Laser Flash Evaporation Of SiOxNy On Room Temperature Polycarbonate, 0000 (2 February 1988); https://doi.org/10.1117/12.941858
Proc. SPIE 0821, Thin Metallic Films From Solvated Metal Atoms, 0000 (2 February 1988); https://doi.org/10.1117/12.941859
Proc. SPIE 0821, Simulation Of The Layer-Growth Dynamics In Silver Films: Dynamics Of Adatom And Vacancy Clusters On Ag(100), 0000 (2 February 1988); https://doi.org/10.1117/12.941860
Proc. SPIE 0821, Multi Layer Semileaky Isolator, 0000 (2 February 1988); https://doi.org/10.1117/12.941861
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