PROCEEDINGS VOLUME 0822
31ST ANNUAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING | 17-21 AUGUST 1987
Raman and Luminescence Spectroscopy in Technology
IN THIS VOLUME

1 Sessions, 27 Papers, 0 Presentations
All Papers  (27)
31ST ANNUAL TECHNICAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING
17-21 August 1987
San Diego, CA, United States
All Papers
Proc. SPIE 0822, Raman Spectroscopy Applied To The Characterization Of Semiconductors And Semiconductor Microstructures, 0000 (19 January 1988); https://doi.org/10.1117/12.941927
Proc. SPIE 0822, Raman Spectroscopic Study Of Point Defects In Bulk GaAs, 0000 (19 January 1988); https://doi.org/10.1117/12.941928
Proc. SPIE 0822, Raman Scattering As A Measure Of Semiconductor Surface Passivation, 0000 (19 January 1988); https://doi.org/10.1117/12.941929
Proc. SPIE 0822, Structural Properties Of Heteroepitaxial Semiconductor Islands By Raman Microscopy, 0000 (19 January 1988); https://doi.org/10.1117/12.941930
Proc. SPIE 0822, Raman And RBS Studies Of Ion Implanted Semiconductors, 0000 (19 January 1988); https://doi.org/10.1117/12.941931
Proc. SPIE 0822, Selected Photoluminesence Transitions In Unintentionally Doped Inp Grown By Molecular Beam Epitaxy, 0000 (19 January 1988); https://doi.org/10.1117/12.941932
Proc. SPIE 0822, Invited Paper Raman And Infrared Spectroscopy Of Potassium Nitrate Thin-Film Ferroelectric Memories, 0000 (19 January 1988); https://doi.org/10.1117/12.941933
Proc. SPIE 0822, Switching Dynamics And Structures Of Ferroelectric Liquid Crystals In The Surface Stabilized Geometry, 0000 (19 January 1988); https://doi.org/10.1117/12.941934
Proc. SPIE 0822, Raman Spectroscopy Of Polycrystalline Diamond Films, 0000 (19 January 1988); https://doi.org/10.1117/12.941935
Proc. SPIE 0822, Raman Study Of Bi2O3 Bistable Switches And Resistors For Neural Networks, 0000 (19 January 1988); https://doi.org/10.1117/12.941936
Proc. SPIE 0822, Raman Microprobe Measurements Of Residual Strains At The Interfaces, 0000 (19 January 1988); https://doi.org/10.1117/12.941937
Proc. SPIE 0822, A New Raman Frequency-Shift Laser With Intracavity Arrangement For High Conversion Efficiency Of The First Order Of Stokes, 0000 (19 January 1988); https://doi.org/10.1117/12.941938
Proc. SPIE 0822, Invited Paper Fast Ion Conducting Glasses And Intercalation Compounds, Constituents Of Solid State Micro-Batteries, Characterized By Light Scattering, Luminescence And Optical Absorption, 0000 (19 January 1988); https://doi.org/10.1117/12.941939
Proc. SPIE 0822, Structural Analysis Of Optical Fiber Preforms Using Raman Microprobe, 0000 (19 January 1988); https://doi.org/10.1117/12.941940
Proc. SPIE 0822, Raman Spectroscopy Of Glass-Crystauine Transformations, 0000 (19 January 1988); https://doi.org/10.1117/12.941941
Proc. SPIE 0822, Raman Spectroscopy Of The 90K Superconductor YBa2Cu307_8 And Its Related Phases, 0000 (19 January 1988); https://doi.org/10.1117/12.941942
Proc. SPIE 0822, Raman Scattering From Rapid Thermally Annealed Tungsten Silicide Thin Films, 0000 (19 January 1988); https://doi.org/10.1117/12.941943
Proc. SPIE 0822, Unenhanced Raman Spectroscopy Of Langmuir-Blodgett Monolayers, 0000 (19 January 1988); https://doi.org/10.1117/12.941944
Proc. SPIE 0822, Molecular Structure Of Six Te1-X Glasses And Oxygen Alloying Effects, 0000 (19 January 1988); https://doi.org/10.1117/12.941945
Proc. SPIE 0822, Invited Paper GaAs High-Gain Photodetectors : Attractive Devices For Raman Spectroscopy, 0000 (19 January 1988); https://doi.org/10.1117/12.941946
Proc. SPIE 0822, Guidelines For The Selection Of Raman Multichannel Detectors, 0000 (19 January 1988); https://doi.org/10.1117/12.941947
Proc. SPIE 0822, Detection Of Faint Luminescence From Faulty Action In Integrated Circuits, 0000 (19 January 1988); https://doi.org/10.1117/12.941948
Proc. SPIE 0822, Hadamard Transform Raman Spectroscopy, 0000 (19 January 1988); https://doi.org/10.1117/12.941949
Proc. SPIE 0822, Fourier Transform Infrared Photoluminescence, 0000 (19 January 1988); https://doi.org/10.1117/12.941950
Proc. SPIE 0822, Fourier Transform Photoluminescence Analysis Of Semiconductor Materials, 0000 (19 January 1988); https://doi.org/10.1117/12.941951
Proc. SPIE 0822, Polymer Thin Film Waveguide Sensors: Characterization Of Scattered Light Intensity At The Waveguide Surface, 0000 (19 January 1988); https://doi.org/10.1117/12.941952
Proc. SPIE 0822, A System For Semiconductor Characterization By Both Photoluminescence And Raman Spectroscopy, 0000 (19 January 1988); https://doi.org/10.1117/12.941953
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