A conceptually new sampling optical oscilloscope has been developed based on the streak camera technology. This is analogous to a conventional sampling oscilloscope but entirely electron-optical in operation and can potentially analyze picosecond optical signals directly. The sampling optical oscilloscope makes use of a photoelectron tube so-called sampling streak tube. This tube is not only a photodetector but also an ultrafast electron sampling device. Optical signals are converted into Photoelectrons, which is the replica of the incident optical signals, at the photocathode. These photoelectrons are then accelerated and deflected to perform traversing of the replica for the purpose of sampling. Part of the electron replica is incident on a Phosphor screen, where it is converted into an optical signal. A ohotomultiplier tube is used to detect the radiation of the screen to analyze the incident signal. The entire waveform of the input signal is obtained by gradu-ally changing the deflection or sampling timing. This unique system permits direct detec tion, digitization and analysis of optical signals in the 350-850 nm region with rise and fall time of 10 ps. It provides a dynamic ranee of > 1000:1, sampling rate of up to 2 MHz, sensitivity of photomultipliers, and breaks the distortion such as overshoot, rincino, cable mismatches or other instrument distortion.