10 March 1988 Characterization Of Frequency Dispersion In Ti-Indiffused Lithium Niobate Optical Devices
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Proceedings Volume 0835, Integrated Optical Circuit Engineering V; (1988) https://doi.org/10.1117/12.942339
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
Abstract
The frequency dispersion of integrated optic interferometers fabricated on different lithium niobate cuts is characterized. Only the configuration that uses the r33 electrooptic coefficient is well behaved.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. L. Nightingale, R. A. Becker, P. C. Willis, J. S. Vrhel, "Characterization Of Frequency Dispersion In Ti-Indiffused Lithium Niobate Optical Devices", Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); doi: 10.1117/12.942339; https://doi.org/10.1117/12.942339
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