10 March 1988 Experimental Evaluation Of Drift And Nonlinearities In Lithium Niobate Interferometric Modulators
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Proceedings Volume 0835, Integrated Optical Circuit Engineering V; (1988) https://doi.org/10.1117/12.942348
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
This paper presents quantitative measurements of two nonideal characteristics of lithium niobate integrated optical devices: nonlinear electrooptic phase modulation and the photo-refractive effect. These effects can occur in any lithium niobate channel-waveguide phase modulator or passive channel waveguide, and may affect the performance of any device that uses these basic building blocks. The measurements described in this paper were performed by means of an integrated-optical Mach-Zehnder interferometer which consists of passive channel waveguides and phase modulators. We have measured a quadratic term in the phase shift vs voltage relation for electrooptic phase modulation. We have also measured the photorefractive effect at wavelengths of 0.85, 1.06, and 1.3 μm, using y- and z-propagation. we evaluate both photovoltaic and photoconductive effects, and give estimates for the constants in a simple model that describes the photorefractive effect.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. E. Betts, G. E. Betts, L. M. Johnson, L. M. Johnson, "Experimental Evaluation Of Drift And Nonlinearities In Lithium Niobate Interferometric Modulators", Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); doi: 10.1117/12.942348; https://doi.org/10.1117/12.942348

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