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1 January 1987 Photodeflection Method Of Measurement Of Kerr-Type Nonlinearities In Materials
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Proceedings Volume 0836, Optoelectronic Materials, Devices, Packaging, and Interconnects; (1987) https://doi.org/10.1117/12.967533
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
Abstract
The Photothermal Deflection Technique is applied to the determination of thermal nonlinearity in samples of Corning-glasses doped with CdSxSel-x (color filter glasses).
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Bertolotti, A. Ferrari, C. Sibilia, G. Suber, P. Jani, and D . Apostol "Photodeflection Method Of Measurement Of Kerr-Type Nonlinearities In Materials", Proc. SPIE 0836, Optoelectronic Materials, Devices, Packaging, and Interconnects, (1 January 1987); https://doi.org/10.1117/12.967533
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