Paper
4 February 1988 Planar InGaAs/InP APD Fabrication Using Silicon Implantation And Regrowth Techniques
P. P. Webb, R. J. McIntyre, M. Holunga, T. Vanderwel
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Proceedings Volume 0839, Components for Fiber Optic Applications II; (1988) https://doi.org/10.1117/12.942559
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
Abstract
Planar InGaAs/InP APD's having a SAM structure have been fabricated making use of ion implantation of silicon as the n-type source for achieving multiplication in the InP region. Quantum efficiencies greater than 80% and gains greater than 50 have been achieved. Noise measurements indicate multiplied bulk dark currents less than 1 nA for a device of diameter 50 micrometers. For certain conditions of the fabrication parameters, response times less than 1 ns are achieved without the use of an intermediate quaternary layer between the InGaAs and InP regions.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. P. Webb, R. J. McIntyre, M. Holunga, and T. Vanderwel "Planar InGaAs/InP APD Fabrication Using Silicon Implantation And Regrowth Techniques", Proc. SPIE 0839, Components for Fiber Optic Applications II, (4 February 1988); https://doi.org/10.1117/12.942559
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Cited by 6 scholarly publications.
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KEYWORDS
Indium gallium arsenide

Diffusion

Heterojunctions

Avalanche photodetectors

Silicon

Ion implantation

Zinc

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