1 January 1987 High-Power Semiconductor Diode Lasers : Reliability Data And Lifetest Methodology
Author Affiliations +
Proceedings Volume 0842, Fiber Optics Reliability: Benign and Adverse Environments; (1987) https://doi.org/10.1117/12.968180
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
Abstract
This paper summarizes the development of high-power semiconductor diode lasers. Both structural and material considerations, and lifetest methodology appropriate for the high power devices are discussed. Also included are the lifetest data of representative state-of-the-art high-power diode lasers.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dilip K. Paul, Dilip K. Paul, } "High-Power Semiconductor Diode Lasers : Reliability Data And Lifetest Methodology", Proc. SPIE 0842, Fiber Optics Reliability: Benign and Adverse Environments, (1 January 1987); doi: 10.1117/12.968180; https://doi.org/10.1117/12.968180
PROCEEDINGS
9 PAGES


SHARE
Back to Top