12 March 1988 How To Design Inspection Systems For Electronic Components
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Proceedings Volume 0850, Optics, Illumination, and Image Sensing for Machine Vision II; (1988) https://doi.org/10.1117/12.942862
Event: Advances in Intelligent Robotics Systems, 1987, Cambridge, CA, United States
Abstract
Image contrast is caused by variations in object reflectivity and lighting. In automated electronic component inspection systems, component reflectivity can vary greatly and lighting is often sub-optimal because electronic assembly systems are crowded. Therefore, images typically have large contrast ranges. Conversely, most machine vision cameras have small contrast ranges, requiring that images be carefully designed to match the camera's transfer function. We discuss how to design these images. During the design process it is necessary to know the ref lectivies of all materials being inspected. We describe an instrument for measuring the ref lectivities of lmm to 25mm diameter regions on objects using lighting and imaging optics that are similar to typical industrial machine vision applications. This instrument measures both specular and diffuse components of reflectivity with a repeatability of ± 1.5%. We present measurements of the reflectivities of typical electronic components and discuss how to use these data in designing Images for component Inspection systems.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norman Wittels, Ross A. Beller, Anthony P. Erwin, "How To Design Inspection Systems For Electronic Components", Proc. SPIE 0850, Optics, Illumination, and Image Sensing for Machine Vision II, (12 March 1988); doi: 10.1117/12.942862; https://doi.org/10.1117/12.942862
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