Color Quality Inspection Of Imaging Device

Toshio Asano; Seiji Hata; Susumu Koishikawa; Youichi Shimizu

doi:10.1117/12.943029

19 October 1987 Color Quality Inspection Of Imaging Device

Toshio Asano, Seiji Hata, Susumu Koishikawa, Youichi Shimizu

Proceedings Volume 0856, IECON '87: Industrial Applications of Robotics & Machine Vision; (1987) https://doi.org/10.1117/12.943029
Event: IECON, Cambridge, 1987, Cambridge, MA, United States

Abstract

This paper describes an automated color defect inspection system of color imaging devices. The system uses color image processing technology, but does not use conventional primary color (R,G,B) components. In this system, two kinds of chrominance signals (R-Y, B-Y) are introduced to analyze color images. Newly developed color edge detection and color contrast calculation methods are used to detect and evaluate the color defects. Color contrast are calculated by analyzing the two dimensional chrominance signal's scatterplot. Algorithms of color defect inspection and experimental results are presented.

Citation Download Citation

Toshio Asano, Seiji Hata, Susumu Koishikawa, and Youichi Shimizu "Color Quality Inspection Of Imaging Device", Proc. SPIE 0856, IECON '87: Industrial Applications of Robotics & Machine Vision, (19 October 1987); https://doi.org/10.1117/12.943029

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