1 June 1988 CCD Application For Interferometric Fringe Analysis Of Eroded Surface
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Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943491
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
An optical heterodyne profilometer has been develooped to get parameters of profiles such as roughness, skewness... Now, it is associated with image processings for automated pattern recognition. Their applications, either on calculated profiles or interference patterns, yield to characteristics of defects on a surface. This device can be a useful tool for the study of erosion phenomena.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Pieralli, C. Pieralli, C. Tribilion, C. Tribilion, R. Devillers, R. Devillers, Y. Cuerveno, Y. Cuerveno, } "CCD Application For Interferometric Fringe Analysis Of Eroded Surface", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943491; https://doi.org/10.1117/12.943491
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