1 June 1988 Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry
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Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943499
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
A holographic arrangement using two holograms symmetrically placed to the perpendicular of the component under investigation will be introduced. By means of a simple difference method using an image processing system, the relative in-plane-displacement and corresponding strain in a defined direction can be determined. The effects of other directional movements (e.g. tilting) will be fully compensated.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Schwab, W. Schwab, J. Gutjahr, J. Gutjahr, A. Ettemeyer, A. Ettemeyer, H. Kockelmann, H. Kockelmann, } "Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943499; https://doi.org/10.1117/12.943499
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