1 June 1988 Photographic Speckle Pattern Interferometry: An Analysis Of Its Fourier Components And Their Application To Electronic Speckle Pattern Interferometry (ESPI).
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Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943498
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
The present paper introduces a double exposure photographic technique that displays, on a single film frame, speckle (addition) correlation fringes identical to those obtained (on substraction) with ESPI. This double exposed photograph is later spatially Fourier filtered to elminate the optical noise giving, as a result, an image of holographic quality. The information given by the Fourier spatial spectrum of the deformed object is at present being studied with the aim of introducing an electronic filter into ESPI. A theoretical account of the above process is given.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F.Mendoza Santoyo, F.Mendoza Santoyo, B. D. Bergquist, B. D. Bergquist, "Photographic Speckle Pattern Interferometry: An Analysis Of Its Fourier Components And Their Application To Electronic Speckle Pattern Interferometry (ESPI).", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943498; https://doi.org/10.1117/12.943498
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