1 June 1988 Pulsed Electronic Speckle Pattern Interferometry In Experimental Stress Analysis
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Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943507
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
Pulsed Laser Electronic Speckle Pattern Interferometry (ESPI) has been shown to be a technique which permits the measurement of in-plane displacements and hence strain under dynamic conditions, in particular radial displacements on rotating components. Conventional optics initially showed the limiting tangential velocity to be of the order of 60 ms-1 for a reasonable area of interference fringe information. Novel optics increases the tangential velocity range to that in excess of 150 ms-1. Use of a pulsed laser removes the otherwise rigorous stability requirement of c/w systems including holography and would allow measurements to be made in an industrial environment. Recent preliminary tests using fibre optics indicate that they may be used for components with limited optical access.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard W.T. Preater, Richard W.T. Preater, } "Pulsed Electronic Speckle Pattern Interferometry In Experimental Stress Analysis", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943507; https://doi.org/10.1117/12.943507
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