1 June 1988 Strain Analysis Using TV Speckle Interferometer
Author Affiliations +
Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943500
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
A theoretical investigation of the signal processing by Electronic Speckle Pattern Interferometry ESPI is presented. Both optical and electronic noise are considered, and the optimum S/N ratio of ESPI with respect to a new reference/object ratio is obtained. The technique of ESPI is applied to study rough object deformation. We assume that the 1st signal representing one state of the object is recorded on a high resolution film while the 2nd signal representing another state of the object is recorded in real time through TV camera. Making use of coherent beam behaving as a carrier wave interference pattern will form over a TV monitor. Experimental results of interference images from the TV screen are photographed showing the validity of the technique.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. El-Ghandoor, H. El-Ghandoor, A. M. Hamed, A. M. Hamed, } "Strain Analysis Using TV Speckle Interferometer", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943500; https://doi.org/10.1117/12.943500
PROCEEDINGS
7 PAGES


SHARE
Back to Top