Paper
18 May 1988 Crystal Lattice Measurements In Superconducting Materials
F. W. Lytle, E. C. Marques, R. B. Greegor, H. G. Ahlstrom, E. M. Larson, D. E Peterson, A. J. Panson
Author Affiliations +
Abstract
The EXAFS technique was used to investigate the structural parameters of the Y and Cu atoms in YBa2Cu307' An antisite disorder of 0.16±0.05 mole fraction was found between the Y and Cu2sites. It was also demonstrated that powder x-ray and neutron diffraction tech-niques are insensitive to this degree of disorder.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. W. Lytle, E. C. Marques, R. B. Greegor, H. G. Ahlstrom, E. M. Larson, D. E Peterson, and A. J. Panson "Crystal Lattice Measurements In Superconducting Materials", Proc. SPIE 0879, Sensing, Discrimination, and Signal Processing and Superconducting Materials and Intrumentation, (18 May 1988); https://doi.org/10.1117/12.943990
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KEYWORDS
Copper

Diffraction

Chemical species

Phase shifts

Superconductors

Oxygen

X-ray diffraction

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