3 May 1988 Four-Wave Mixing And Scanning Tunneling Microscopy Of Semiconductor Clusters
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Proceedings Volume 0881, Optical Computing and Nonlinear Materials; (1988) https://doi.org/10.1117/12.944070
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
Semiconductor structures in lower dimensions, dubbed quantum dots, exhibit novel properties which result from size quantization of their charge carriers, as well as from their large surface-to-volume ratio. Optical measurements, combined with scanning tunneling microscopy, can provide the detailed information required to model the nonlinear optical response of these clusters.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dror Sarid, B P McGinnis, Tammy D Henson, "Four-Wave Mixing And Scanning Tunneling Microscopy Of Semiconductor Clusters", Proc. SPIE 0881, Optical Computing and Nonlinear Materials, (3 May 1988); doi: 10.1117/12.944070; https://doi.org/10.1117/12.944070
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