3 May 1988 Interframe Jitter Measurement Technique
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Proceedings Volume 0890, Infrared Systems and Components II; (1988) https://doi.org/10.1117/12.944283
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
A noninvasive technique for the measurement of image jitter has been developed. This technique has been applied to a common module thermal imager to show that scanner position oscillations about linearity are exacerbated by power supply fluctuations.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. C. Brown, J. C. Brown, } "Interframe Jitter Measurement Technique", Proc. SPIE 0890, Infrared Systems and Components II, (3 May 1988); doi: 10.1117/12.944283; https://doi.org/10.1117/12.944283
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