29 June 1988 Matrices, Ellipsometers, And Magneto Optical Data Storage
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Proceedings Volume 0891, Polarization Considerations for Optical Systems; (1988) https://doi.org/10.1117/12.944310
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
The operation of a Photo Elastic Modulator (PEM) type ellipsometer is described via Mueller matrix elements. The phase shift (6) and the relative amplitude attenuation ratio (tan ik) between orthogonal polarization components is contained in the Mueller matrix elements and can be obtained via combinations of measured matrix elements. A phase shift measurement accuracy of ±0.2° has been obtained without calibration. A computer controlled implementation is described along with simple algorithms to extract the ellipsometric constants. The Mueller matrix of a magneto optic film media system has been used along with one for a "leaky " beamsplitter to form the optical readout system matrix for an ideal system. One of the Stokes parameters is porportional to the differential detection signal often used in MO data detection schemes.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernard W. Bell, "Matrices, Ellipsometers, And Magneto Optical Data Storage", Proc. SPIE 0891, Polarization Considerations for Optical Systems, (29 June 1988); doi: 10.1117/12.944310; https://doi.org/10.1117/12.944310
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