29 June 1988 Spectropolarimetry Of Electro-Optical Materials
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Proceedings Volume 0891, Polarization Considerations for Optical Systems; (1988) https://doi.org/10.1117/12.944293
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
This paper treats the fundamentals of infrared spectropolarimetry as a step in understanding and designing better spatial light modulators. It describes the issues in converting a Fourier transform Epectrometer to perform spectropolarimetric measurements, and includes mathematics to interpret the resulting spectropolarimetric data. Two distinct differences exist between this proposed instrumentation and previous infrared crystal optics studies; 1.) this instrument acquires data at all wavelengths within its spectral range, and 2.) it measures Mueller polarization matrices. Conventional measurements with laser polarimeters take birefringence data with applied fields at a few laser wavelengths. With the spectropolarimeter, data is obtained on and near absorption bands where the most interesting phenomenae occur. By measuring Mueller matrices as a function of wavelength, data is acquired on polarization and scattering, effects which will ultimately limit the performance of a modulating crystal. Thus, more data is available on which to compare materials and optimize modulator designs. Better modulators must result from such investigations.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis H. Goldstein, Russell A. Chipman, David B. Chenault, "Spectropolarimetry Of Electro-Optical Materials", Proc. SPIE 0891, Polarization Considerations for Optical Systems, (29 June 1988); doi: 10.1117/12.944293; https://doi.org/10.1117/12.944293
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