29 June 1988 Spectropolarimetry Of Electro-Optical Materials
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Proceedings Volume 0891, Polarization Considerations for Optical Systems; (1988) https://doi.org/10.1117/12.944293
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
This paper treats the fundamentals of infrared spectropolarimetry as a step in understanding and designing better spatial light modulators. It describes the issues in converting a Fourier transform Epectrometer to perform spectropolarimetric measurements, and includes mathematics to interpret the resulting spectropolarimetric data. Two distinct differences exist between this proposed instrumentation and previous infrared crystal optics studies; 1.) this instrument acquires data at all wavelengths within its spectral range, and 2.) it measures Mueller polarization matrices. Conventional measurements with laser polarimeters take birefringence data with applied fields at a few laser wavelengths. With the spectropolarimeter, data is obtained on and near absorption bands where the most interesting phenomenae occur. By measuring Mueller matrices as a function of wavelength, data is acquired on polarization and scattering, effects which will ultimately limit the performance of a modulating crystal. Thus, more data is available on which to compare materials and optimize modulator designs. Better modulators must result from such investigations.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis H. Goldstein, Dennis H. Goldstein, Russell A. Chipman, Russell A. Chipman, David B. Chenault, David B. Chenault, } "Spectropolarimetry Of Electro-Optical Materials", Proc. SPIE 0891, Polarization Considerations for Optical Systems, (29 June 1988); doi: 10.1117/12.944293; https://doi.org/10.1117/12.944293


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