Paper
27 June 1988 Influence Of Self-Focusing On Bulk Laser-Induced Damage
M J Soileau, Eric W VanStryland, William E Williams
Author Affiliations +
Proceedings Volume 0895, Laser Optics for Intracavity and Extracavity Applications; (1988) https://doi.org/10.1117/12.944435
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
In previous work [1] we reported that the power of importance in self-focusing experiments using Gaussian spatial profile is the second critical power, P2, defined by P2=3.77 P1 rather than the often quoted P1=Cλ2/(32π22). Here n2 is the nonlinear refractive index, c the speed of light and A the wavelength (both in vacuum). The factor of 3.77 is a numerical factor coming from computer calculations as discussed by Marburger [2]. We also presented a method by which we could obtain n2 at irradiances very near to damage In addition, we showed the experimental conditions under which self-focusing is unimportant in damage experiments. We have now extended these results so that in damage experiments where self-focusing is important we can estimate the reduced spot size within the bulk at damage and, thus, obtain the damaging electric field magnitude. This we do by observing the far field time integrated spatial irradiance distribution. We present data for Si02, NaCl, BK-7, and CS2.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M J Soileau, Eric W VanStryland, and William E Williams "Influence Of Self-Focusing On Bulk Laser-Induced Damage", Proc. SPIE 0895, Laser Optics for Intracavity and Extracavity Applications, (27 June 1988); https://doi.org/10.1117/12.944435
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KEYWORDS
Laser induced damage

Optical testing

Laser optics

Fused quartz

Numerical analysis

Polarization

Laser damage threshold

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