2 June 1988 Characterization Of Thin Film Magnetic Recording Heads Using Transverse Kerr Effect
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Proceedings Volume 0898, Miniature Optics and Lasers; (1988) https://doi.org/10.1117/12.944558
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
This paper proposes a new cost effective method for the testing of thin film magnetic recording heads. The primary advantage of this technique is that through use of magneto-optics, test can be carried out at the wafer level and thereby eliminate defective heads before additional manufacturing costs are added to the product.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Avtar Singh, Avtar Singh, Thomas Fugate, Thomas Fugate, } "Characterization Of Thin Film Magnetic Recording Heads Using Transverse Kerr Effect", Proc. SPIE 0898, Miniature Optics and Lasers, (2 June 1988); doi: 10.1117/12.944558; https://doi.org/10.1117/12.944558
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