2 June 1988 Measurement Of Laser Diode Spot Size And Source Astigmatism Using A Phase-Shifting Interferometer
Author Affiliations +
Proceedings Volume 0899, Optical Storage Technology and Applications; (1988) https://doi.org/10.1117/12.944602
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
A phase-shifting Mach-Zehnder interferometer was used to measure wavefront phase errors for an uncollimated laser diode source. The axial separation of the beam waists was then computed from the measured wavefront astigmatism and compared with directly measured values and the manufacturer's specifications. An optical disk head was also measured and the focused spot profile was calculated from the measured wavefront and beam apodization. The calculated profile was then compared with spot size measurements using a knife edge scanner.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Scott L. DeVore, Scott L. DeVore, } "Measurement Of Laser Diode Spot Size And Source Astigmatism Using A Phase-Shifting Interferometer", Proc. SPIE 0899, Optical Storage Technology and Applications, (2 June 1988); doi: 10.1117/12.944602; https://doi.org/10.1117/12.944602
PROCEEDINGS
7 PAGES


SHARE
Back to Top