24 June 1988 Analysis And Measurement Of Resolution Of Shadow Mask CRT Displays
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Proceedings Volume 0901, Image Processing, Analysis, Measurement, and Quality; (1988) https://doi.org/10.1117/12.944718
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
Automated measurement techniques have been developed to determine the resolution of any shadow mask CRT-observer configuration. It is based on a linear systems approach which determines the brightness profile that an observer sees at a given distance from the CRT. From the profile, a modulation depth is calculated which is related to visual resolution. Given the limits for visual resolution, the results of the linear systems analysis and measurements can provide design parameters for available CRTs which include shadow mask pitch, spot size, spatial frequency of displayed patterns, observer distance, and color.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harry Veron, Harry Veron, } "Analysis And Measurement Of Resolution Of Shadow Mask CRT Displays", Proc. SPIE 0901, Image Processing, Analysis, Measurement, and Quality, (24 June 1988); doi: 10.1117/12.944718; https://doi.org/10.1117/12.944718
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