11 July 1988 Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation
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Proceedings Volume 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements; (1988) https://doi.org/10.1117/12.945493
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
With the recent compilation of the low-energy x-ray photoabsorption and scattering factors, it has become more practical to determine low-energy x-ray fluorescence yields and to check the scattering cross sections of materials by x-ray photoexcitation. The x-ray fluorescence yield measurements of carbon in polypropylene, oxygen in mylar, and fluorine in polytetrafluorethylene (teflon), by Al x-ray photoexcitation will be presented. Also a comparison of calculated to observed Al Ka x-ray scattering from these plastics will be presented.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert G Hockaday, Robert G Hockaday, } "Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation", Proc. SPIE 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements, (11 July 1988); doi: 10.1117/12.945493; https://doi.org/10.1117/12.945493
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