11 July 1988 The Use Of Multilayer Diffraction Gratings In The Determination Of X-Ray, Soft X-Ray, And Vuv Elemental Scattering Cross-Sections
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Proceedings Volume 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements; (1988) https://doi.org/10.1117/12.945490
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
The dispersion of light by multilayer combined microstructure diffraction gratings is affected by the scattering cross-sections of the elements used to synthesize the multilayer. This effect will be analytically evaluated, and the results of model calculations for spectral regions of interest presented. Experimental results for these domains will also be presented and compared with data from the literature and with the results of modelling calculations.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Troy W Barbee, Troy W Barbee, } "The Use Of Multilayer Diffraction Gratings In The Determination Of X-Ray, Soft X-Ray, And Vuv Elemental Scattering Cross-Sections", Proc. SPIE 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements, (11 July 1988); doi: 10.1117/12.945490; https://doi.org/10.1117/12.945490
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