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27 June 1988 A Composite Approach To The Identification Of High-Level Topological Features In A Histopathologic Image
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Abstract
Analysis of the large amounts of image data obtainable from very-high-speed scanning laser microscopes places severe demands on computer software and hardware architectures. The automated calculation of features over entire images can provide quantitative data useful to a pathologist who must make a diagnosis. A program that identifies objects of diagnostic interest in an image must utilize a model of the image. An expert system is an effective method for building abstract models of object hierarchies and for utilizing heuristic information. In this paper we discuss a composite approach to image understanding and assessment that utilizes an expert system to control a set of image processing functions for the recognition of various objects in an image.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. P. Kuhn, H. G. Bartels, P. H. Bartels, D. L. Richards, J. S. Saffer, and R. L. Shoemaker "A Composite Approach To The Identification Of High-Level Topological Features In A Histopathologic Image", Proc. SPIE 0914, Medical Imaging II, (27 June 1988); https://doi.org/10.1117/12.968670
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