11 October 1988 Design Of A Sample Chamber For Spatial Emissivity Measurements Using Thermal Imaging
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Proceedings Volume 0916, Infrared Systems--Design and Testing; (1988) https://doi.org/10.1117/12.945564
Event: Sira/SPIE Infrared Meeting, 1988, London, United Kingdom
Optical and electronic modifications have been made to a TICM II thermal imager by NPL to allow its use in near-focus radiometric measurements. A GEMS image processing system has customised enhancements to the existing GEMMA sofware permitting pixel-by-pixel restoration and radiometric calibration of images with user-defined algorithms. To allow emissivity measurements to be made at near-ambient temperatures, a non-reflecting cryogenic sample chamber is necessary to remove the reflected component of sample radiance. The design and construction of such a sample chamber is discussed in detail in relation to the NPL facility nearing completion for measuring the emissivity of non-uniform materials or objects. Particular features are the avoidance of vacuum systems for purging or insulation, and the geometrical and thermal design to give ease of handling and a long operating period from a single filling with liquid nitrogen.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. J. J. Clarke, N. A. Boyd, J. K. Leonard, "Design Of A Sample Chamber For Spatial Emissivity Measurements Using Thermal Imaging", Proc. SPIE 0916, Infrared Systems--Design and Testing, (11 October 1988); doi: 10.1117/12.945564; https://doi.org/10.1117/12.945564

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