Fast And Objective MRTD Measurement

A. N. de Jong; S. J. M. Bakker

doi:10.1117/12.945571

11 October 1988 Fast And Objective MRTD Measurement

A. N. de Jong, S. J. M. Bakker

Proceedings Volume 0916, Infrared Systems--Design and Testing; (1988) https://doi.org/10.1117/12.945571
Event: Sira/SPIE Infrared Meeting, 1988, London, United Kingdom

Abstract

Manufacturers and Users of the Thermal Imagers have spent very much time upon the definition and measurement of the generally accepted performance curve: MRTD (Minimum Resolvable Temperature Difference). The need for a cheap and fast, objective measurement method has considerably increased since the large scale introduction of thermal imagers. This paper contains a contribution to such a method, based upon simple targets, a CCD-camera and an IBM-PC with frame-grabber unit and fast computation algorithms.

Citation Download Citation

A. N. de Jong and S. J. M. Bakker "Fast And Objective MRTD Measurement", Proc. SPIE 0916, Infrared Systems--Design and Testing, (11 October 1988); https://doi.org/10.1117/12.945571

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available