11 October 1988 Fast And Objective MRTD Measurement
Author Affiliations +
Proceedings Volume 0916, Infrared Systems--Design and Testing; (1988) https://doi.org/10.1117/12.945571
Event: Sira/SPIE Infrared Meeting, 1988, London, United Kingdom
Abstract
Manufacturers and Users of the Thermal Imagers have spent very much time upon the definition and measurement of the generally accepted performance curve: MRTD (Minimum Resolvable Temperature Difference). The need for a cheap and fast, objective measurement method has considerably increased since the large scale introduction of thermal imagers. This paper contains a contribution to such a method, based upon simple targets, a CCD-camera and an IBM-PC with frame-grabber unit and fast computation algorithms.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. N. de Jong, A. N. de Jong, S. J. M. Bakker, S. J. M. Bakker, } "Fast And Objective MRTD Measurement", Proc. SPIE 0916, Infrared Systems--Design and Testing, (11 October 1988); doi: 10.1117/12.945571; https://doi.org/10.1117/12.945571
PROCEEDINGS
19 PAGES


SHARE
RELATED CONTENT

An alternate method for performing MRTD measurements
Proceedings of SPIE (May 29 2014)
Future of MRT
Proceedings of SPIE (August 31 1993)
Assessing The Performance Of Thermal Imagers
Proceedings of SPIE (October 11 1988)
Recent Advances In Testing Of Thermal Imagers
Proceedings of SPIE (September 20 1989)
Objective Measurement Of MRTD
Proceedings of SPIE (October 11 1988)
Objective MRTD measurement: an update
Proceedings of SPIE (October 01 1990)

Back to Top