11 October 1988 Thermal Imager Spectral Sensitivity Analyser
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Proceedings Volume 0916, Infrared Systems--Design and Testing; (1988) https://doi.org/10.1117/12.945568
Event: Sira/SPIE Infrared Meeting, 1988, London, United Kingdom
A system is described which enables the spectral sensitivity of thermal images to be measured. The instrument covers the spectral range from 2.4 to 24 microns, and so it is useful for analysing the response of both 3.5 microns and 8-14 micron imager systems. It offers the facility to evaluate the linearity as well as the spectral performance of the imaging system.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. S. Smith, D. S. Smith, P. M. Goodwin, P. M. Goodwin, "Thermal Imager Spectral Sensitivity Analyser", Proc. SPIE 0916, Infrared Systems--Design and Testing, (11 October 1988); doi: 10.1117/12.945568; https://doi.org/10.1117/12.945568


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