Paper
1 January 1988 Aqueous Base Developable Deep UV Resist Systems Based On Novel Monomeric And Polymeric Dissolution Inhibitors
Hiroshi Ito
Author Affiliations +
Abstract
Certain "onium salt" photochemical acid generators such as triphenylsulfonium and diphenyliodonium metal halides work as dissolution inhibitors for novolac resins in a fashion similar to diazonaphthoquinone. The two-component deep UV positive resists can be imaged in an aqueous base at 25 m.1/cm2 of 254 nm radiation. The system allows addition of a third component. For example, polyphthalaldehyde, a novel and efficient dissolution inhibitor miscible with novolac resins, is completely reverted to the starting monomer in the novolac matrix upon postbake. The design is based on removal of the polymeric dissolution inhibitor from the exposed areas through acid-catalyzed depolymerization to volatile monomer. Such three-component resist systems offer high deep UV sensitivity (2 mJ/cmh), high contrast (4.2), and wide formulation and process latitudes.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroshi Ito "Aqueous Base Developable Deep UV Resist Systems Based On Novel Monomeric And Polymeric Dissolution Inhibitors", Proc. SPIE 0920, Advances in Resist Technology and Processing V, (1 January 1988); https://doi.org/10.1117/12.968299
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CITATIONS
Cited by 10 scholarly publications and 6 patents.
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KEYWORDS
Polymers

Deep ultraviolet

Ultraviolet radiation

Lithography

Absorption

Photoresist processing

Absorbance

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